Metallic Ratio Equivalent-Time Sampling and Application to TDC Linearity Calibration-Reference-Cited by-同舟云学术

Metallic Ratio Equivalent-Time Sampling and Application to TDC Linearity Calibration

Published:2022-06 Issue:2 Volume:22 Page:142-153
ISSN:1530-4388
Container-title:IEEE Transactions on Device and Materials Reliability
language:
Short-container-title:IEEE Trans. Device Mater. Relib.

Author:

Yamamoto Shuhei¹^ORCID,Sasaki Yuto¹,Zhao Yujie¹,Kuwana Anna¹,Katoh Kentaroh¹,Zhang Zheming¹,Wei Jianglin¹,Tran Tri Minh¹,Katayama Shogo¹,Sato Keno²,Ishida Takashi²,Okamoto Toshiyuki²,Ichikawa Tamotsu²,Nakatani Takayuki¹,Hatayama Kazumi¹^ORCID,Kobayashi Haruo¹^ORCID

Affiliation:

1. Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, Gunma, Japan

2. V & V Engineering Department, Circuit Technology Division, ROHM Semiconductor, Yokohama, Japan

Funder

Japan Society for the Promotion of Science (JSPS) KAKENHI

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/7298/9789687/09736996.pdf?arnumber=9736996

Reference14 articles.

1. History of the theory of numbers;dickson;Diophantine Analysis,2005

2. A CMOS time to digital converter VLSI for high-energy physics

3. An Analysis of Stochastic Self-Calibration of TDC Using Two Ring Oscillators

4. Stochastic TDC architecture with self-calibration

5. Input Signal and Sampling Frequencies Requirements for Efficient ADC Testing with Histogram Method

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