Stochastic TDC architecture with self-calibration-Reference-Cited by-同舟云学术

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Stochastic TDC architecture with self-calibration

Published:2010-12 Issue: Volume: Page:
ISSN:
Container-title:2010 IEEE Asia Pacific Conference on Circuits and Systems
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Author:

Ito Satoshi,Nishimura Shigeyuki,Kobayashi Haruo,Uemori Satoshi,Tan Yohei,Takai Nobukazu,Yamaguchi Takahiro J.,Niitsu Kiichi

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5767825/5774732/05774740.pdf?arnumber=5774740

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Kintex ultrascale’s multi-segment digital tapped delay lines with controlled characteristics for precise time-to-digital conversion;Metrology and Measurement Systems;2024-08-19

2. A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation;2023 IEEE International Test Conference in Asia (ITC-Asia);2023-09-12

3. Calibration Methods for Time-to-Digital Converters;Sensors;2023-03-03

4. How the Author's Group Came Up with Ideas in Analog/Mixed-Signal Circuit and System Area;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences;2023

5. Challenges for Waveform Sampling and Related Technologies;2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT);2022-10-25

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