Input Signal and Sampling Frequencies Requirements for Efficient ADC Testing with Histogram Method-Reference-Cited by-同舟云学术

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Input Signal and Sampling Frequencies Requirements for Efficient ADC Testing with Histogram Method

Published:2021-06-27 Issue: Volume: Page:
ISSN:
Container-title:2021 36th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC)
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Author:

Zhao Yujie,Kuwana Anna,Yamamoto Shuhei,Sasaki Yuto,Kobayashi Haruo,Tran Tri Minh,Katayama Shogo,Wei Jianglin,Nakatani Takayuki,Hatayama Kazumi,Sato Keno,Ishida Takashi,Okamoto Toshiyuki,Ichikawa Tamotsu

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9501257/9501258/09501423.pdf?arnumber=9501423

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Metallic Ratio Equivalent-Time Sampling and Application to TDC Linearity Calibration;IEEE Transactions on Device and Materials Reliability;2022-06

2. Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies;Journal of Electronic Testing;2022-02

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