Author:
Zimmer Brian,Toh Seng Oon,Vo Huy,Lee Yunsup,Thomas Olivier,Asanovic Krste,Nikolic Borivoje
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
47 articles.
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1. A Low-Power Variation-Tolerant 7T SRAM With Enhanced Read Sensing Margin for Voltage Scaling;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-08
2. Assist Techniques for Radiation Hardened SRAM in Space Applications;2023 IEEE International Symposium on Smart Electronic Systems (iSES);2023-12-18
3. Impact of Voltage Scaling on Soft Errors Susceptibility of Multicore Server CPUs;56th Annual IEEE/ACM International Symposium on Microarchitecture;2023-10-28
4. SRAM Vmin Scaling via Negative Wordline;2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS);2023-08-06
5. Optimization of the aspect ratio to enhance the power and noise-margin of a standard 6T(S6T)-SRAM cell;2022 Fourth International Conference on Emerging Research in Electronics, Computer Science and Technology (ICERECT);2022-12-26