The Impact of Logic Gates Susceptibility in Overall Circuit Reliability Analysis-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

The Impact of Logic Gates Susceptibility in Overall Circuit Reliability Analysis

Published:2022-05-28 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE International Symposium on Circuits and Systems (ISCAS)
language:
Short-container-title:

Author:

Pontes Matheus F.¹,Oliveira Ingrid F. V.¹,Schvittz Rafael B.²,Rosa Leomar S.¹,Butzen Paulo F.³

Affiliation:

1. Centro de Desenvolvimento Tecnológico - Universidade Federal de Pelotas - UFPel,Pelotas,Brazil

2. Centro de Ciências Computacionais - Universidade Federal do Rio Grande - FURG,Rio Grande,Brazil

3. Universidade Federal do Rio Grande do Sul - UFRGS,Departamento de Eng. Elétrica,Porto Alegre,Brazil

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9937201/9937203/09937573.pdf?arnumber=9937573

Reference27 articles.

1. Circuit Reliability Through Probabilistic Transfer Matrix

2. Signal probability for reliability evaluation of logic circuits

3. The Suitability of the SPR-MP Method to Evaluate the Reliability of Logic Circuits

4. Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults

5. Reliability evaluation of logic circuits using probabilistic gate models

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. ARA-RCIV: Identifying Reliability-Critical Input Vectors of Logic Circuits Based on the Association Rules Analysis Approach;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-08

2. Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach;Journal of Electronic Testing;2024-05-28

3. Design of Educational Model of 4-Bit Multiplier;2024 ELEKTRO (ELEKTRO);2024-05-20

4. Design of Educational Model of 8-Bit Serial Communication;2024 ELEKTRO (ELEKTRO);2024-05-20

5. A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits;IEEE Transactions on Computers;2024-01

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3