Ultrasonic Bonding of Ag and Ag-Alloy Ribbon—An Innovative Alternative for High Power IC Packages

Author:

Chen Chun-HaoORCID,Lin Yan-Cheng,Groth Anne,Lai Yu-Chang,Lin Chia-YingORCID,Chang Heng-Ming,Chuang Tung-HanORCID

Funder

Industrial and Academic Cooperation Programs of Wire Technology Company Ltd.

Ministry of Science and Technology, Taiwan

Doctoral Student Study Abroad Program 2019

German Academic Exchange Service (DAAD) by the short-term grants program 2019

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Electronic, Optical and Magnetic Materials

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Investigation of Creep Failure in Ag-4Pd Bonding Wire Under Dynamic Mechanical Analysis Tests;IEEE Transactions on Components, Packaging and Manufacturing Technology;2023-12

2. Ultrasonic Bonding of Ag Ribbon on Si Wafers With Various Backside Metallization;International Journal of Manufacturing, Materials, and Mechanical Engineering;2023-11-14

3. Review of Double-Sided Cooling Power Modules for Driving Electric Vehicles;IEEE Transactions on Device and Materials Reliability;2023-06

4. Research Progress on Bonding Wire for Microelectronic Packaging;Micromachines;2023-02-11

5. Effect of Solder Voids on Chip Crack during Al Ribbon Bonding;2022 IEEE 39th International Electronics Manufacturing Technology Conference (IEMT);2022-10-19

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