Planar GaN Power Integration – The World is Flat
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9371868/9371888/09372069.pdf?arnumber=9372069
Cited by 44 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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3. Suppression of Hot-Electron-Induced Dynamic RON Degradation in p-GaN Gate HEMT Using Active Passivation and Virtual Body;2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD);2024-06-02
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5. Development of Enhancement-Mode GaN p-FET With Post-Etch Wet Treatment on p-GaN Gate HEMT Epi-Wafer;IEEE Transactions on Electron Devices;2024-04
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