Ferroelectric Thickness Dependent Domain Interactions in FEFETs for Memory and Logic: A Phase-field Model based Analysis
Author:
Affiliation:
1. Purdue University
2. Rochester Institute of Technology
3. University of Notre Dame
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9371868/9371888/09372099.pdf?arnumber=9372099
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