Genetic algorithm based approach for low power combinational circuit testing-Reference-Cited by-同舟云学术

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Genetic algorithm based approach for low power combinational circuit testing

Published: Issue: Volume: Page:
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Container-title:16th International Conference on VLSI Design, 2003. Proceedings.
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Author:

Chattopadhyay S.,Choudhary N.

Publisher

IEEE Comput. Soc

Link

http://xplorestaging.ieee.org/ielx5/8427/26547/01183192.pdf?arnumber=1183192

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Thermal-aware Test Data Compression for System-on-Chip Based on Modified Bitmask Based Methods;Journal of Electronic Testing;2020-10

2. Approach of genetic algorithm for power‐aware testing of 3D IC;IET Computers & Digital Techniques;2019-07-16

3. A Batteryless Energy Harvesting Storage System for Implantable Medical Devices Demonstrated In Situ;Circuits, Systems, and Signal Processing;2018-08-11

4. Genetic Algorithm-based thermal uniformity–aware X-filling to reduce peak temperature during testing;Measurement and Control;2018-07-02

5. Test Power Reduction by Simultaneous Don’t Care Filling and Ordering of Test Patterns Considering Pattern Dependency;International Journal of Engineering;2018-05

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