A March 5n FSM-Based Memory Built-In Self-Test (MBIST) Architecture with Diagnosis Capabilities-Reference-Cited by-同舟云学术

A March 5n FSM-Based Memory Built-In Self-Test (MBIST) Architecture with Diagnosis Capabilities

Published:2022-08-15 Issue: Volume: Page:
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Container-title:2022 IEEE International Conference on Semiconductor Electronics (ICSE)
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Author:

Ng Kok Heng¹,Alias Nurul Ezaila²,Hamzah Afiq²,Tan Michael Loong Peng²,Sheikh Usman Ullah²,Wahab Yasmin Abdul³

Affiliation:

1. Intel Microelectronics, Malaysia Sdn Bhd,Malaysia,11900

2. School of Electrical Engineering, Universiti Teknologi Malaysia,Johor Bahru,Malaysia,81310

3. Nanotechnology & Catalysis Research Centre, Universiti Malaya,Kuala Lumpur,Malaysia,50603

Funder

UTM

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9862946/9862950/09863160.pdf?arnumber=9863160

Reference8 articles.

1. An Efficient March (5n) FSMBased Memory Built-In Self Test (MBIST) Architecture;kong;2021 IEEE Regional Symposium on Micro and Nanoelectronics (RSM),0

2. Fast BIST Mechanism for Faster Validation of Memory Array

3. Memory Built-In Self-Repair using redundant words;schöbe;Proc Int Test Conf 2001,0

4. Enabling ECC and Repair Features in an eFuse Box for Memory Repair Applications

5. Essentials of Electronic Testing for Digital;bushnell;Memory & Mixed-Signal VLSI Circuits,2002

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1. MBIST Implementation and Evaluation in FPGA Based on Low-Complexity March Algorithms;Journal of Circuits, Systems and Computers;2023-12-28

2. A robust low-power fsm cordic lms filter design for exponential noise removal in pacemaker;International Journal of Electronics;2023-10-09