Fully Differential 4-V Output Range 14.5-ENOB Stepwise Ramp Stimulus Generator for On-Chip Static Linearity Test of ADCs-Reference-Cited by-同舟云学术

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Fully Differential 4-V Output Range 14.5-ENOB Stepwise Ramp Stimulus Generator for On-Chip Static Linearity Test of ADCs

Published:2019-02 Issue:2 Volume:27 Page:281-293
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Renaud Guillaume^ORCID,Diallo Mamadou,Barragan Manuel J.^ORCID,Mir Salvador^ORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx7/92/8628286/08528559.pdf?arnumber=8528559

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A high constancy and noise suppression voltage shift generator in SEIR-based BIST circuit for ADC linearity test;Microelectronics Journal;2024-09

2. A stimulus identification method for high-resolution ADC linearity testing using low-precision ramp signals;IEICE Electronics Express;2024

3. Machine Learning Support for Diagnosis of Analog Circuits;Machine Learning Support for Fault Diagnosis of System-on-Chip;2022-10-22

4. Digital-to-Analog Hardware Trojan Attacks;IEEE Transactions on Circuits and Systems I: Regular Papers;2022-02

5. High-speed CMOS ramp generator using proteretic comparator;2021 IEEE Asia Pacific Conference on Circuit and Systems (APCCAS);2021-11-22

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