Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Link
http://xplorestaging.ieee.org/ielx7/92/8118264/08052501.pdf?arnumber=8052501
Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A latch-based sense amplifier with improved performance for single ended SRAM application;Physica Scripta;2023-05-30
2. A Switching NMOS Based Single Ended Sense Amplifier for High Density SRAM Applications;ACM Transactions on Design Automation of Electronic Systems;2023-03-19
3. An aging monitoring scheme for SRAM decoders;Integration;2023-01
4. On BTI Aging Rejuvenation in Memory Address Decoders;2022 IEEE 23rd Latin American Test Symposium (LATS);2022-09-05
5. Application-aware aging analysis and mitigation for SRAM Design-for-Relability;Microelectronics Reliability;2022-07
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