Application-aware aging analysis and mitigation for SRAM Design-for-Relability-Reference-Cited by-同舟云学术

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Application-aware aging analysis and mitigation for SRAM Design-for-Relability

Published:2022-07 Issue: Volume:134 Page:114548
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Listl Alexandra,Mueller-Gritschneder Daniel,Schlichtmann Ulf

Funder

Deutsche Forschungsgemeinschaft

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference37 articles.

1. Analyzing the effects of peripheral circuit aging of embedded SRAM architectures;Kinseher,2017

2. Characterization of granularity and redundancy for SRAMs for optimal yield-per-area;Cha,2008

3. Integral impact of BTI, PVT variation, and workload on SRAM sense amplifier;Agbo,2017

4. Mitigation of sense amplifier degradation using input switching;Kraak,2017

5. Impact and mitigation of sense amplifier aging degradation using realistic workloads;Kraak,2017

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