Transition-Code Based Linearity Test Method for Pipelined ADCs With Digital Error Correction-Reference-Cited by-同舟云学术

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Transition-Code Based Linearity Test Method for Pipelined ADCs With Digital Error Correction

Published:2011-12 Issue:12 Volume:19 Page:2158-2169
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Lin Jin-Fu,Chang Soon-Jyh,Kung Te-Chieh,Ting Hsin-Wen,Huang Chih-Hao

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx5/92/6059694/05648403.pdf?arnumber=5648403

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fully Differential 4-V Output Range 14.5-ENOB Stepwise Ramp Stimulus Generator for On-Chip Static Linearity Test of ADCs;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2019-02

2. Evaluating the Uncertainty of Digitizing Waveform Recorders Coherently With the GUM;IEEE Transactions on Instrumentation and Measurement;2018-10

3. Low-cost methodology for fault diagnosis and localization in pipelined ADCs;Integration;2018-09

4. Modeling and simulation of an eight-bit auto-configurable successive approximation register analog-to-digital converter for cardiac and neural implants;SIMULATION;2017-06-29

5. Parameters and Methods for ADCs Testing Compliant With the Guide to the Expression of Uncertainty in Measurements;IEEE Transactions on Instrumentation and Measurement;2017-03

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