1. Mixed-signal test impact to SOC commercialization;Arabi,2010
2. Tester-assisted calibration and screening for digitally-calibrated ADCs;Chang;IEEE Trans. Circ. Syst.,2011
3. Signature testing and diagnosis of high precision ∑ Δ ADC dynamic specifications using model parameter estimation;Kook,2011
4. Failure localization of logic circuits using voltage contrast considering state of transistors;Funatsu,2013
5. Digitally Assisted Pipeline ADCs. Theory and Implementation;Murmann,2004