Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
6 articles.
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1. A Test Point Selection Method Based on Fault Response Matrices Framework;IEEE Transactions on Instrumentation and Measurement;2023
2. SPAR: A New Test-Point Insertion Using Shared Points for Area Overhead Reduction;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-11
3. DeepTPI: Test Point Insertion with Deep Reinforcement Learning;2022 IEEE International Test Conference (ITC);2022-09
4. Special Session: Survey of Test Point Insertion for Logic Built-in Self-test;2020 IEEE 38th VLSI Test Symposium (VTS);2020-04
5. A Survey on Test Point Insertion (TPI) Schemes;2020 International Conference on Inventive Computation Technologies (ICICT);2020-02