Reliable Power Gating With NBTI Aging Benefits-Reference-Cited by-同舟云学术

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Reliable Power Gating With NBTI Aging Benefits

Published:2016-08 Issue:8 Volume:24 Page:2735-2744
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Rossi Daniele,Tenentes Vasileios,Yang Sheng,Khursheed Saqib,Al-Hashimi Bashir M.

Funder

Engineering and Physical Sciences Research Council

Department of Electrical Engineering and Electronics, University of Liverpool, U.K.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx7/92/7519042/07407405.pdf?arnumber=7407405

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Design and Lifetime Estimation of Low-Power 6-Input Look-Up Table Used in Modern FPGA;Journal of Circuits, Systems and Computers;2022-11-24

2. Run-Time Thermal Management for Lifetime Optimization in Low-Power Designs;Electronics;2022-01-29

3. Differential Aging Sensor Using Subthreshold Leakage Current to Detect Recycled ICs;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-12

4. A Support Vector Regression based Machine Learning method for on-chip Aging Estimation;2021 4th International Conference on Computing & Information Sciences (ICCIS);2021-11-29

5. NBTI-Aware Power Gating Design with Dynamically Varying Stress Probability Control on Sleep Transistor;Journal of Circuits, Systems and Computers;2021-02-27

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