Author:
Bahukudumbi Sudarshan,Chakrabarty Krishnendu
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
2 articles.
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1. Fundamentals of VLSI Testing;Power-Aware Testing and Test Strategies for Low Power Devices;2009-08-13
2. Test-Length and TAM Optimization for Wafer-Level Reduced Pin-Count Testing of Core-Based SoCs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2009-01