Affiliation:
1. CNRS, IM2NP, Aix-Marseille University, Marseille, France
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
6 articles.
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1. Device Reliability and Effect of Temperature on Memristors: Nanostructured V₂O₅;IEEE Transactions on Device and Materials Reliability;2024-06
2. Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing;2024 IEEE 25th Latin American Test Symposium (LATS);2024-04-09
3. On the Reliability of RRAM-Based Neural Networks;2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC);2023-10-16
4. Characterization and Test of Intermittent Over RESET in RRAMs;2023 IEEE 32nd Asian Test Symposium (ATS);2023-10-14
5. Device-Aware Test for Ion Depletion Defects in RRAMs;2023 IEEE International Test Conference (ITC);2023-10-07