Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Cited by
16 articles.
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1. SCAR: Power Side-Channel Analysis at RTL Level;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-06
2. Challenges in Feasible Simulation of Side-Channel Attack Resistance for Cryptographic Hardware;2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa);2024-05-20
3. Power Attack Vulnerability Assessment of Circuit-Level PRESENT Encryption IP Using Artificial Intelligence Mechanisms;Journal of Circuits, Systems and Computers;2024-03-28
4. Triangular Pulse-Based IC Switching Current Model Using Multiple Regression Analysis for Fast Side-Channel Attack Prediction;IEEE Transactions on Electromagnetic Compatibility;2024-02
5. Prediction Accuracy Improvement of Side-channel Information Leakage by Using EM-Circuit Co-simulation of PDN with Filters;2023 International Symposium on Electromagnetic Compatibility – EMC Europe;2023-09-04