Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV-Reference-Cited by-同舟云学术

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Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV

Published:2018-01 Issue:1 Volume:65 Page:293-306
ISSN:1549-8328
Container-title:IEEE Transactions on Circuits and Systems I: Regular Papers
language:
Short-container-title:IEEE Trans. Circuits Syst. I

Author:

van Santen Victor M.^ORCID,Martin-Martinez Javier,Amrouch Hussam,Nafria Montserrat Maqueda,Henkel Jorg

Funder

German Research Foundation (DFG) through the Dependable Embedded Systems Priority Program

Spanish MINECO and ERDF

Generalitat de Catalunya

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/8919/8248584/07971963.pdf?arnumber=7971963

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