On the volatility of oxide defects: Activation, deactivation, and transformation-Reference-Cited by-同舟云学术

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On the volatility of oxide defects: Activation, deactivation, and transformation

Published:2015-04 Issue: Volume: Page:
ISSN:
Container-title:2015 IEEE International Reliability Physics Symposium
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Author:

Grasser T.,Waltl M.,Goes W.,Wimmer Y.,El-Sayed A.-M.,Shluger A.L.,Kaczer B.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7106273/7112653/07112739.pdf?arnumber=7112739

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