Reliability of SiC power devices and its influence on their commercialization - review, status, and remaining issues
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IEEE
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http://xplorestaging.ieee.org/ielx5/5482567/5488659/05488834.pdf?arnumber=5488834
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2. Degradation Mechanism and Failure Analysis of Planar Type SiC MOSFETs Under Cyclic Stress of Surge Current;2022 13th International Conference on Reliability, Maintainability, and Safety (ICRMS);2022-08-21
3. The Impact of the Hexagonal and Circular Cell Designs on the Characteristics and Ruggedness for 4H-SiC MPS Diodes;IEEE Transactions on Electron Devices;2022-03
4. Review of Silicon Carbide Processing for Power MOSFET;Crystals;2022-02-11
5. Aging Mechanisms and Accelerated Lifetime Tests for SiC MOSFETs: An Overview;IEEE Journal of Emerging and Selected Topics in Power Electronics;2022-02
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