A Markovian Approach for Detecting Failures in the Xilinx SEM core
Author:
Affiliation:
1. KTH Royal Institute of Technology,Stockholm,Sweden
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9973804/9974184/09974240.pdf?arnumber=9974240
Reference12 articles.
1. Single-event upsets characterization & evaluation of xilinx ultrascale soft error mitigation (sem ip) tool;maillard;Radiation Effects Data Workshop (REDW) 2016 IEEE,2016
2. Single event mitigation for Xilinx 7-series FPGAs
3. Improving the Effectiveness of TMR Designs on FPGAs with SEU-Aware Incremental Placement
4. Radiation Effects on Deep Submicrometer SRAM-Based FPGAs Under the CERN Mixed-Field Radiation Environment
5. Impact of TMR design layouts on single event tolerance in SRAM-based FPGAs
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2. SEU protection design for the prototype readout electronics of MAPS-based STCF inner tracker;Journal of Instrumentation;2023-11-01
3. Investigation of the Xilinx SEM Core on a Zynq-Based Software-Defined Radio Under Proton Irradiation;2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC);2023-07
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