Author:
Cannon Matthew,Keller Andrew,Wirthlin Michael
Cited by
19 articles.
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1. Improving Fault Tolerance for FPGA SoCs Through Post Radiation Design Analysis;ACM Transactions on Reconfigurable Technology and Systems;2024-07-19
2. Smart-Redundancy With In Memory ECC Checking: Low-Power SEE-Resistant FPGA Architectures;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-08
3. Characterization of Interconnect Fault Effects in SRAM-based FPGAs;2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS);2023-05-03
4. Bitstream- Level Interconnect Fault Characterization for SRAM-based FPGAs;2023 Design, Automation & Test in Europe Conference & Exhibition (DATE);2023-04
5. Low Earth Orbit Satellite Security and Reliability: Issues, Solutions, and the Road Ahead;IEEE Communications Surveys & Tutorials;2023