Comparison between SRAM SEE cross-sections from ion beam testing with those obtained using a new picosecond pulsed laser facility
Author:
Affiliation:
1. Space Dept., DERA, Farnborough, UK
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Link
http://xplorestaging.ieee.org/ielx5/23/18599/00856477.pdf?arnumber=856477
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