SEREEL2 – a new laser single-event effects test system with benchmark results

Author:

Sharp Richard E.1,Crombie Andrew1,Chong Chris1

Affiliation:

1. Radtest Ltd,Oxfordshire,UK,OX11 0QT

Funder

BD

Publisher

IEEE

Reference10 articles.

1. Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies

2. In-flight Anomalies on Electronic Devices

3. Utilisation of pulsed laser for SEE testing study at two wavelengths;jones;report reference ESA_QCA010801S_C,2001

4. Comparison of single-event transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions;buchner;the 7th European Conference on Radiation and Its Effects on Components and Systems 2003 RADECS 2003,2003

5. An overview of the applications of a pulsed laser system for SEU testing

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