Author:
Bian Kun,Walker D. M. H.,Khatri Sunil P.,Lahiri Shayak
Cited by
4 articles.
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1. At-Speed Path Delay Test;2015 IEEE 24th North Atlantic Test Workshop;2015-05
2. Pattern Generation for Understanding Timing Sensitivity to Power Supply Noise;Journal of Electronic Testing;2014-12-20
3. Pseudo Functional Path Delay Test through Embedded Memories;Journal of Electronic Testing;2014-12-18
4. Techniques to Improve the Efficiency of SAT Based Path Delay Test Generation;2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems;2014-01