Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
13 articles.
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1. Use of input necessary assignments for test generation based on merging of test cubes;IET Computers & Digital Techniques;2015-03
2. Non-Test Cubes for Test Generation Targeting Hard-to-Detect Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2013-12
3. Power-Aware Test Data Compression and BIST;Power-Aware Testing and Test Strategies for Low Power Devices;2009-08-13
4. Logic Testing;Wiley Encyclopedia of Computer Science and Engineering;2009-03-16
5. Fault simulation and test generation;Electronic Design Automation;2009