1. Goel P. Rosales B.C.: ‘Test generation and dynamic compaction of tests’.Proc. Test Conf. 1979 pp.189–192
2. Pomeranz I. Reddy L.N. Reddy S.M.: ‘COMPACTEST: a method to generate compact test sets for combinational circuits’.Proc. Int. Test Conf. 1991 pp.194–203
3. Chang J.‐S. Lin C.‐S.: ‘Test set compaction for combinational circuits’.Proc. Asian Test Symp. 1992 pp.20–25
4. MINT – an exact algorithm for finding minimum test sets;Matsunaga Y.;IEICE Trans. Fundam.,1993