Effects of Carbon Incorporation on Electrical Characteristics and Thermal Stability of Ti/TiO<sub>2</sub>/<i>n</i>-Ge MIS Contact-Reference-Cited by-同舟云学术

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Effects of Carbon Incorporation on Electrical Characteristics and Thermal Stability of Ti/TiO₂/n-Ge MIS Contact

Published:2022 Issue: Volume:10 Page:84689-84693
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Park Iksoo¹^ORCID,Shin Seonghwan¹^ORCID,Kim Jungsik²^ORCID,Jin Bo³,Lee Jeong-Soo¹^ORCID

Affiliation:

1. Department of Electrical Engineering, Pohang University of Science and Technology (POSTECH), Pohang-si, South Korea

2. Department of Electrical Engineering, Gyeongsang National University, Jinju-si, South Korea

3. Research and Development Department, IGEST—Innovative General Electronics Sensor Technology Company Ltd., Pohang-si, South Korea

Funder

National Research and Development Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science and ICT

Samsung-POSTECH Research Center (SPRC) funded by Samsung Electronics

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/6287639/9668973/09853537.pdf?arnumber=9853537

Reference22 articles.

1. Analysis of Atomistic Dopant Variation and Fermi Level Depinning in Nanoscale Contacts

2. Fermi-Level Unpinning Technique with Excellent Thermal Stability for n-Type Germanium

3. Fermi level depinning and contact resistivity reduction using a reduced titania interlayer in n-silicon metal-insulator-semiconductor ohmic contacts

4. Reduction in specific contact resistivity to n+ Ge using TiO2 interfacial layer;lin;IEEE Electron Device Lett,2012

5. Interfacial band alignment and structural properties of nanoscale TiO2 thin films for integration with epitaxial crystallographic oriented germanium

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Current-voltage (I-V) characteristics of Au/n-Ge heterostructure based on cobalt phthalocyanine (CoPc) interlayer;Materials Today: Proceedings;2023-02

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