A four-step method for de-embedding gigahertz on-wafer CMOS measurements-Reference-Cited by-同舟云学术

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A four-step method for de-embedding gigahertz on-wafer CMOS measurements

Published:2000-04 Issue:4 Volume:47 Page:734-740
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Kolding T.E.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/18018/00830987.pdf?arnumber=830987

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