Compensating Probe Misplacements in On-Wafer <i>S</i>-Parameters Measurements-Reference-Cited by-同舟云学术

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Compensating Probe Misplacements in On-Wafer S-Parameters Measurements

Published:2022-11 Issue:11 Volume:70 Page:5213-5223
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Schmidt Robin¹^ORCID,Clochiatti Simone²,Mutlu Enes²,Weimann Nils²^ORCID,Ferrero Andrea¹,Dieudonne Michael¹,Schreurs Dominique M. M.-P.³^ORCID

Affiliation:

1. Keysight Technologies Inc., Rotselaar, Belgium

2. Bauelemente der Höchstfrequenz-Elektronik (Components for High-Frequency Electronics), University of Duisburg-Essen, Duisburg, Germany

3. WaveCoRE Departement, Katholieke Universiteit Leuven (KU Leuven), Leuven, Belgium

Funder

European Union’s Horizon 2020 Research and Innovation Program

TeraApps)

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/22/9939120/09900436.pdf?arnumber=9900436

Reference23 articles.

1. Traveling Waves and Power Waves: Building a Solid Foundation for Microwave Circuit Theory

2. Characteristic impedance determination using propagation constant measurement

3. Transmission line capacitance measurement

4. Causal Characteristic Impedance Determination Using Calibration Comparison and Propagation Constant

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. On-Wafer Capacitor Characterization Including Uncertainty Estimates Up to 1.0 THz;IEEE Transactions on Terahertz Science and Technology;2024-09

2. Interlaboratory Investigation of On-wafer S-parameter Measurements from 110 GHz to 1.1 THz;2023 53rd European Microwave Conference (EuMC);2023-09-19

3. GRNN-Based Scattering Parameter Modeling Investigation for HBT at Different Temperature;IEEE Access;2023

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