Back-Biasing to Performance and Reliability Evaluation of UTBB FDSOI, Bulk FinFETs, and SOI FinFETs-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Back-Biasing to Performance and Reliability Evaluation of UTBB FDSOI, Bulk FinFETs, and SOI FinFETs

Published:2018-01 Issue:1 Volume:17 Page:36-40
ISSN:1536-125X
Container-title:IEEE Transactions on Nanotechnology
language:
Short-container-title:IEEE Trans. Nanotechnology

Author:

Chang Wen-Teng,Shih Cheng-Ting,Wu Jhao-Lin,Lin Shih-Wei,Cin Li-Gong,Yeh Wen-Kuan

Funder

Ministry of Science and Technology

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications

Link

http://xplorestaging.ieee.org/ielx7/7729/8249911/07932194.pdf?arnumber=7932194

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Study on the regulation factors and mechanism of self-heating effects in non-rectangular 14 nm bulk FinFET^*;Semiconductor Science and Technology;2024-08-14

2. High performance junctionless FDSOI SiGe channel p-FinFET with high ION/IOFF ratio and excellent SS;Materials Science in Semiconductor Processing;2024-03

3. Investigation of Cylindrical Gate All Around Field Effect Transistors Exploring Variation in Low Voltage Using Visual TCAD;2023 International Conference on Next Generation Electronics (NEleX);2023-12-14

4. Analysis of Traps Behavior Related to Body-Biased Hot Carrier Degradation in 14 nm nFinFETs;IEEE Transactions on Electron Devices;2023-12

5. High speed ultra-low-lower lulse-triggered JLFET Flip-Flop;Modern Physics Letters B;2023-10-19

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP