Low-voltage hot-electron currents and degradation in deep-submicrometer MOSFETs-Reference-Cited by-同舟云学术

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Low-voltage hot-electron currents and degradation in deep-submicrometer MOSFETs

Published:1990-07 Issue:7 Volume:37 Page:1651-1657
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Chung J.E.,Jeng M.-C.,Moon J.E.,Ko P.-K.,Hu C.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx1/16/2015/00055752.pdf?arnumber=55752

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