A Coverage-Driven Constraint Random-Based Functional Verification Method of Pipeline Unit
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IEEE
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http://xplorestaging.ieee.org/ielx5/5222859/5222860/05223257.pdf?arnumber=5223257
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Five Stage Pipelined MIPS Processor Verification Scoreboard Module using UVM;2023 International Conference in Advances in Power, Signal, and Information Technology (APSIT);2023-06-09
2. Five Stage Pipelined MIPS Processor Verification Coverage Module Using UVM;2023 9th International Conference on Advanced Computing and Communication Systems (ICACCS);2023-03-17
3. Bio-Inspired Machine Learning Algorithm: Genetic Algorithm;Machine Learning for Model Order Reduction;2018
4. New Trends in SoC Verification: UVM, Bug Localization, Scan-C0068ain-Based Methodology, GA-Based Test Generation;Analog Circuits and Signal Processing;2016
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