A new lossy substrate de-embedding method for sub-100 nm RF CMOS noise extraction and modeling-Reference-Cited by-同舟云学术

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A new lossy substrate de-embedding method for sub-100 nm RF CMOS noise extraction and modeling

Published:2006-02 Issue:2 Volume:53 Page:339-347
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Jyh-Chyurn Guo ,Yi-Min Lin

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/33392/01580872.pdf?arnumber=1580872

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Modeling the Coupling through Substrate for Frequencies up to 100GHz;2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems;2015-04

2. Impact of impedance-dependent receiver gain on the extracted channel thermal noise in sub-100 nm MOSFETs;Mathematical and Computer Modelling;2013-07

3. Low-Capacitance SCR Structure for RF I/O Application;IEEE Transactions on Electromagnetic Compatibility;2013-04

4. A New Method for Layout-Dependent Parasitic Capacitance Analysis and Effective Mobility Extraction in Nanoscale Multifinger MOSFETs;IEEE Transactions on Electron Devices;2011-09

5. Microwave noise modeling of FinFETs;Solid-State Electronics;2011-02

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