Author:
Eggersgluss Stephan,Miyase Kohei,Wen Xiaoqing
Cited by
6 articles.
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1. Formal Techniques;Design for Testability, Debug and Reliability;2021
2. Constraint-Based Pattern Retargeting for Reducing Localized Power Activity During Testing;2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS);2018-04
3. Identification of Efficient Clustering Techniques for Test Power Activity on the Layout;2017 IEEE 26th Asian Test Symposium (ATS);2017-11
4. On Generation of Delay Test with Capture Power Safety;Communications in Computer and Information Science;2017
5. On Optimal Power-Aware Path Sensitization;2016 IEEE 25th Asian Test Symposium (ATS);2016-11