Investigation of the Impact of Externally Applied Out-of-Plane Stress on Ferroelectric FET-Reference-Cited by-同舟云学术

Investigation of the Impact of Externally Applied Out-of-Plane Stress on Ferroelectric FET

Published:2021-02 Issue:2 Volume:42 Page:264-267
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Liu Yefan^ORCID,Clima Sergiu^ORCID,Hiblot Gaspard,Matagne Philippe^ORCID,Popovici Mihaela Loana,Kaczer Ben^ORCID,Velenis Dimitrios,De Wolf Ingrid^ORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/55/9337249/09314286.pdf?arnumber=9314286

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