IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters-Reference-Cited by-同舟云学术

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IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters

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IEEE

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http://xplorestaging.ieee.org/ielx5/5692954/5692955/05692956.pdf?arnumber=5692956

Cited by 29 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. ADC Dynamic Parameter Testing Scheme Under Relaxed Conditions;Journal of Electronic Testing;2024-07-17

2. A BIST Approach to Approximate Co-Testing of Embedded Data Converters;IEEE Design & Test;2024-06

3. Test and performance of the CMS ECAL barrel data conversion and digital processing ASIC for HL-LHC;Journal of Instrumentation;2024-03-01

4. Long-Term Infrasound Sensor Calibration and Characterization;Seismological Research Letters;2024-02-06

5. Test and performance of the LiTE-DTU ASIC for the HL-LHC upgrade of the CMS ECAL barrel;Journal of Instrumentation;2024-02-01

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