Structure Design and Characteristics of Sense-Switch pFlash Devices-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Structure Design and Characteristics of Sense-Switch pFlash Devices

Published:2021-10-29 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE 3rd International Conference on Circuits and Systems (ICCS)
language:
Short-container-title:

Author:

Liu Guozhu¹,Yu ZongGuang²,Wei Jinghe²,Li Bing¹,Zhao Wei³

Affiliation:

1. Southeast University,School of Electronic Science and Engineering,Nanjing, 210096,China

2. Corporation No.58 Research Institute,China Electronics Technology Group,Wuxi,Jiangsu,China

3. Group Corporation No.58 Research Institute,China Electronics Technology,Wuxi, 214035,China

Funder

National Natural Science Foundation of China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9697107/9697111/09697211.pdf?arnumber=9697211

Reference11 articles.

1. Characterization and modeling of a highly reliable ONO antifuse for high-performance FPGA and PROM;liu;International Journal of Materials Science and Applications,2016

2. Experimental Validation of a Tool for Predicting the Effects of Soft Errors in SRAM-Based FPGAs

3. Investigation of TID and Dynamic Burn-In-Induced $V_{{T}}$ Shift on RTG4 Flash-Based FPGA

4. Total ionizing dose effects on flash-based field programmable gate array

5. Reliable and Radiation-Hardened Push-Pull pFlash Cell for Reconfigured FPGAs

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Programming mechanism and characteristics of Sense-Switch pFlash cells;Microelectronics Reliability;2023-04

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP