Experimental Validation of a Tool for Predicting the Effects of Soft Errors in SRAM-Based FPGAs-Reference-Cited by-同舟云学术

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Experimental Validation of a Tool for Predicting the Effects of Soft Errors in SRAM-Based FPGAs

Published:2007-12 Issue:6 Volume:54 Page:2576-2583
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Sterpone L.,Violante M.,Sorensen R. Harboe,Merodio D.,Sturesson F.,Weigand R.,Mattsson S.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/4394990/04395082.pdf?arnumber=4395082

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