Author:
Bodhe Shraddha,Amyeen M. Enamul,Galendez Clariza,Mooers Houston,Pomeranz Irith,Venkataraman Srikanth
Cited by
12 articles.
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1. Dummy Faulty Units for Reduced Fail Data Volume From Logic Faults;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-11
2. Using Fault Detection Tests to Produce Diagnostic Tests Targeting Large Sets of Candidate Faults;2022 IEEE 31st Asian Test Symposium (ATS);2022-11
3. Partially-Specified Output Response for Reduced Fail Data Volume;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022
4. Hybrid Pass/Fail and Full Fail Data for Reduced Fail Data Volume;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021-08
5. Logic Diagnosis with Hybrid Fail Data;ACM Transactions on Design Automation of Electronic Systems;2021-05-31