Author:
Wu Rui,Blaabjerg Frede,Wang Huai,Liserre Marco,Iannuzzo Francesco
Cited by
145 articles.
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1. An Analytical Carrier Recombination Turn-Off Transient Model for High-Voltage IGBTs;IEEE Transactions on Power Electronics;2024-06
2. Three-dimensional Thermal Modeling Method of Power Device Chip Based on Intelligent Algorithm;2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia);2024-05-17
3. Fault Location and Tolerant Control Strategy for Power Electronic Transformers with a Single IGBT Open-Circuit Fault;2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia);2024-05-17
4. An Improved Stress-strain Model Considering the Aging Effect of Solder Layers;2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia);2024-05-17
5. Fault Diagnosis for the Cascaded H-Bridge Multilevel Converter Considering Fault Coupling Between Switches and Sensors;2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia);2024-05-17