Design and Control of a Dual-Probe Atomic Force Microscope-Reference-Cited by-同舟云学术

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Design and Control of a Dual-Probe Atomic Force Microscope

Published:2018-02 Issue:1 Volume:23 Page:424-433
ISSN:1083-4435
Container-title:IEEE/ASME Transactions on Mechatronics
language:
Short-container-title:IEEE/ASME Trans. Mechatron.

Author:

Loganathan Muthukumaran^ORCID,Al-Ogaidi Ayad,Bristow Douglas A.^ORCID

Funder

National Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx7/3516/8293754/08125779.pdf?arnumber=8125779

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Hybrid Reluctance Actuator to Compensate for Parasitic Force for Nanopositioning;2024 IEEE International Conference on Advanced Intelligent Mechatronics (AIM);2024-07-15

2. An Electromagnetic-Piezoelectric Hybrid Actuated Nanopositioner for Atomic Force Microscopy;IEEE Transactions on Instrumentation and Measurement;2024

3. An integrated hinged dual-probe for co-target fast switching imaging;Review of Scientific Instruments;2023-12-01

4. Design and Analysis of a Compliant Mechanism with Variable Stiffness;2023 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM);2023-06-28

5. Investigating the effect of the mean path length on reluctance actuator output force characterization;Review of Scientific Instruments;2022-11-01

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