End-to-end modeling of variability-aware neural networks based on resistive-switching memory arrays-Reference-Cited by-同舟云学术

End-to-end modeling of variability-aware neural networks based on resistive-switching memory arrays

Published:2022-10-03 Issue: Volume: Page:
ISSN:
Container-title:2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC)
language:
Short-container-title:

Author:

Glukhov Artem¹,Lepri Nicola¹,Milo Valerio²,Baroni Andrea³,Zambelli Cristian⁴,Olivo Piero⁴,Perez Eduardo³,Wenger Christian³,Ielmini Daniele¹

Affiliation:

1. Politecnico di Milano and IU.NET,Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB),Milan,Italy,20133

2. Applied Materials Italia Srl,Reggio Emilia,Italy,42124

3. IHP-Leibniz-Institut für Innovative Mikroelektronik,Frankfurt (Oder),Germany,15236

4. Università degli Studi di Ferrara,Dipartimento di Ingegneria,Ferrara,Italy,44122

Publisher

IEEE

Link

Reference28 articles.

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. On the Reliability of RRAM-Based Neural Networks;2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC);2023-10-16