A New Foreground-Perception Cycle-Consistent Adversarial Network for Surface Defect Detection With Limited High-Noise Samples
Author:
Affiliation:
1. School of Mechanical Engineering and Electronic Information, China University of Geosciences, Wuhan, China
2. State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China
Funder
National Natural Science Foundation of China
Major Special Science and Technology Project of Hubei Province
State Key Lab of Digital Manufacturing Equipment and Technology
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Science Applications,Information Systems,Control and Systems Engineering
Link
http://xplorestaging.ieee.org/ielx7/9424/10288179/10058534.pdf?arnumber=10058534
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