A New Dual-Branch Network With Global Information for the Surface Defect Detection on Solar PV Wafer-Reference-Cited by-同舟云学术

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A New Dual-Branch Network With Global Information for the Surface Defect Detection on Solar PV Wafer

Published:2024-03-15 Issue:6 Volume:24 Page:9197-9207
ISSN:1530-437X
Container-title:IEEE Sensors Journal
language:
Short-container-title:IEEE Sensors J.

Author:

Zuo Lei¹^ORCID,Su Shaoquan¹,Fan Shihang¹,Li Hui¹,Wen Long²^ORCID,Li Xinyu³^ORCID,Xiong Kaiguo⁴

Affiliation:

1. School of Mechanical Engineering and Electronic Information, China University of Geosciences, Wuhan, China

2. Key Laboratory of Advanced Manufacturing Technology, Ministry of Education, Guizhou University, Guiyang, China

3. State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China

4. Wuhan Regional Climate Center, Wuhan, China

Funder

Shenzhen Science and Technology Program

Joint Open Fund of Guizhou Provincial Department of Education

Hubei Natural Science Foundation

Open Project of Henan Key Laboratory of Intelligent Manufacturing of Mechanical Equipment, Zhengzhou University of Light Industry

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/7361/10472410/10419143.pdf?arnumber=10419143

Reference37 articles.

1. Real-Time Defect Detection Scheme Based on Deep Learning for Laser Welding System

2. A Channel Attention-Based Method for Micro-Motor Armature Surface Defect Detection

3. Rolling Surface Defect Inspection for Drum-Shaped Rollers Based on Deep Learning

4. Zero-DD: Zero-sample defect detection for industrial products

5. A Pixel-Level Segmentation Convolutional Neural Network Based on Global and Local Feature Fusion for Surface Defect Detection

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A New Feature Pyramid Network With Bidirectional Jump Connection Network for Small Defect Detection on Solar PV Wafer;IEEE Sensors Journal;2024-09-01

2. EFS-YOLO: a lightweight network based on steel strip surface defect detection;Measurement Science and Technology;2024-08-06

3. AEDN-YOLO: an efficient one-stage detection network for strip steel surface defects;Engineering Research Express;2024-08-06

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