A New Feature Pyramid Network With Bidirectional Jump Connection Network for Small Defect Detection on Solar PV Wafer
Author:
Affiliation:
1. School of Mechanical Engineering and Electronic Information, China University of Geosciences, Wuhan, China
2. Key Laboratory of Advanced Manufacturing Technology, Ministry of Education, Guizhou University, Guiyang, Guizho, China
Funder
National Key Research and Development Program of China
Shenzhen Science and Technology Program
Basic and Applied Basic Research Foundation of Guangdong Province
State Key Laboratory of Mechanical Transmission for Advanced Equipment
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Link
http://xplorestaging.ieee.org/ielx8/7361/10660640/10601577.pdf?arnumber=10601577
Reference32 articles.
1. An effective MID-based visual defect detection method for specular car body surface
2. CGTD-Net: Channel-Wise Global Transformer-Based Dual-Branch Network for Industrial Strip Steel Surface Defect Detection
3. Self-Supervised Defect Representation Learning for Label-Limited Rail Surface Defect Detection
4. Performance Analysis of Silicon Technologies Photovoltaic Cells Using Artificial Light Source in Different Spectra
5. Cascaded detection method for surface defects of lead frame based on high-resolution detection images
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