Using Custom Fault Models to Improve Understanding of Silicon Failures
Author:
Affiliation:
1. QCT Mobile SIM Bangalore, Qualcomm India Pvt. Ltd.
2. QCT Product and Test Engineering, Qualcomm Technologies Inc.
3. Ranganathan QCT Failure Analysis, Qualcomm Technologies Inc.
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9983856/9983857/09983910.pdf?arnumber=9983910
Reference19 articles.
1. Improving CMOS open defect coverage using hazard activated tests
2. On the testing of hazard activated open defects
3. Complete Test Sets for Logic Functions
4. On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults
5. Cell-aware experiences in a high-quality automotive test suite
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